Tunable Wide-Dynamic-Range Polarization-Insensitive Digital Wavelength Converter with Built-In-Test based on Novel Integrated Chip in Ruggedized Modul

The proposed project will undertake the research, design, and development of key concepts and technologies for tunable wide-dynamic-range polarization-insensitive digital wavelength converter with built-in-test based on novel integrated chip in ruggedized module for civilian and military DWDM optical networks. This project is proposed by a strong multidisciplinary team of industry and academic researchers, including device design and packaging experts from OptoNet Inc. and device physics and fabrication experts from the Northwestern University. Phase I will focus on systematic design and feasibility studies of the proposed tunable wavelength converter to demonstrate the technical feasibility of the proposed technology. The feasibility will lay the ground work for Phase II. The proposed wavelength converter module will have the following attractiveness: (1) Orders of magnitude lower power consumption than the typical SOA wavelength converters. (2) Operation with large input signal dynamic range of >20dB without feedback control. (3) Module packaging in low profile module of 100Gbit/s possible.