SBIR/STTR Research Award
A Multi-Technique Platform for Non-Invasive PCB Performance Evaluation
Award amount
$99,998Program and phase
SBIR · Phase IAward year
2005Award details
- Awarding agency
- Department of Defense
- Branch
- Air Force
- Recipient company
- NEOCERA, LLC
- Proposal award date
- 2005-05-09
- Contract end date
- 2006-02-09
- UEI
- RGN2BNEVNG73
- Solicitation number
- 2005.1
- Topic code
- AF05-275
Research abstract
A highly sensitive magnetic microscope with submicron resolution will be used to identify and assess difference between good, defective, and failing printed circuit boards (PCB)in order to develop a non-invasive technique for automatically detecting defects in PCBs. Three sensor types, SQUID, GMR, and MTJ will be tested to determine the best sensor or combination of sensors for this application. An optimized subtraction algorithm between images acquired on standard good and failing parts will be used to classify changes associated with common defects. The magnetic sensors used will have the ability to acquire 3-dimensional information on circuit damage with resolution better than 100 nanometers. In Phase II, magnetic data will be coupled with 3-D Xray technology to acquire a complete physical and electrical profile of defects in PCBs.
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Development of Nanoelectronic Materials and Devices, Based on Novel Metal-Oxide Interfaces
- SBIR Phase II: Fault Isolation of Open Circuits in Semiconductor Products using Magnetic Current Imaging
- Development of Epitaxial GaN Films for RF Communications
- SBIR Phase I: Fault Isolation of Open Circuits in Semiconductor Products using Magnetic Current Imaging
- Superconducting Current Leads for Cryogenic Systems
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Laser-based Broadband Spectral Imaging for Failure Detection of Printed Circuit Boards and Components
- Multi-modal, Non-contact, Automated Test Equipment (ATE) for PCBs
- Laser-based Broadband Spectral Imaging for Failure Detection of Printed Circuit Boards and Components
Research funding history
43 SBIR/STTR records share this UEI (1989–2009). Reported award amounts total $7,573,684. Reported amounts are not federal obligations.
Phases: Phase I, Phase II
Agencies: Department of Defense, National Aeronautics and Space Administration, National Science Foundation, Department of Commerce, Department of Energy