SBIR/STTR Research Award

Wafer Level Supercritical Carbon Dioxide-Based Metal Deposition for Microelectronic Applications

Award identifier 80e5098b888edbd550c1032478fd53de850b62acd44a723b94b407e8d832bfcaAwarding agency Environmental Protection Agency

Award amount

$225,000

Program and phase

SBIR · Phase II

Award year

2005

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Award details

Awarding agency
Environmental Protection Agency
Branch
Not reported
Recipient company
MiCell Technologies, Inc.
Proposal award date
2005-04-01
Contract end date
2006-06-30
UEI
Not reported
Solicitation number
PR-NC-04-10483
Topic code
04-NCER-P1

Research abstract

This research project involves the application, development, and commercial scale up of a process for the deposition of copper and copper barrier materials such as ruthenium, titanium, and other metals. This process could replace copper electroplating currently used to fill deep trenches and thin-film deposition in microelectronic circuit manufacturing. In addition, physical vapor deposition and electroless deposition of barrier materials also could be replaced. The electroplating process generates large quantities of aqueous wastes with copper ions and other dangerous chemicals that must be treated in place. MiCell Technologies, Inc.’s proposed process uses liquid or supercritical carbon dioxide (CO2) solvent to transport a metal precursor to a semiconducting wafer substrate. In addition to being environmentally benign, this process provides additional control of the metal deposition process to create superior films and electrical interconnects. This research project is part of an overall strategy to replace aqueous and organic solvents in microelectronics fabrication. The wafer to be coated will be immersed in supercritical CO2 solvent containing the precursor. The wafer is heated independently of the chamber and a reactant is added to initiate a reaction with a metal precursor leaving behind a metal film on the wafer substrate surface. Because of the low surface tension and viscosity of the CO2 phase, the precursor will penetrate uniformly into the narrow gaps on the surface of the patterned substrate. After the conversion of the metal precursor, a solid metallic layer remains on the surface that forms the desired interconnect, thin layer structure, or barrier layer. Because of the never-ending demand for faster processor speeds and enhanced storage capacities, smaller and more sophisticated structures are required in modern semiconductor products. As dimensions shrink, copper interconnects and metallic barrier and seed layers will be scrutinized like never before in efforts to achieve maximum yields. New processes and materials will be adopted in the coming years to meet the challenges of evolving semiconductor products. As an environmentally benign and technically superior process, metal deposition from supercritical CO2 will have a preferred position in the marketplace.

Technology keywords

Not reported

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Agency intelligence

Environmental Protection Agency

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