SBIR/STTR Research Award
High Energy Density Dielectrics for Pulsed Power Capacitors
Award amount
$1,175,000Program and phase
SBIR · Phase IIAward year
2004Award details
- Awarding agency
- Department of Defense
- Branch
- Air Force
- Recipient company
- K SYSTEMS CORP.
- Proposal award date
- 2004-02-17
- Contract end date
- 2006-02-17
- UEI
- Not reported
- Solicitation number
- 2002.2
- Topic code
- OSD02-EP01
Research abstract
Aluminum Nitride (AlN)/Oxygen -Doped AlN (O-AlN) possess the unique properties of high dielectric strength, high resistivity, high decomposition temperature, chemical inertness, great hardness and excellent thermal conductivity. In Phase I, we demonstrated that AlN/O-AlN films can be deposited directly onto smooth aluminum surfaces with good adhesion, and that AlN/O-Aln films are highly flexible, making them suitable for the production of wound capacitors. The Phase II research will demonstrate an economical manufacturing technique using a dual magnetron sputtering system with a continuous rolling mechanism for the mass production of rolled capacitors, and will also demonstrate packaged AlN/O-AlN capacitors of high energy density, smaller size, and lower weight as compared to current film capacitors. The main objective of Phase II will involve the assembly and demonstration of a manufacturing operation which combines the AlN/O-AlN deposition system, and the capacitor rolling operation process into a single modular system housed within a 100 square foot area. The whole operation will be assembled within a clean room enclosure. This basic modular fabrication system could then be duplicated for the mass production of capacitors in the Phase III effort.
Technology keywords
Not reported
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