SBIR/STTR Research Award

High Energy Density Dielectrics for Pulsed Power Capacitors

Award identifier de1c41b52926755ae1bf9efa1643c9a270eef3e5c33530c96acaaa9d4a849301Awarding agency Department of Defense · Air Force

Award amount

$1,175,000

Program and phase

SBIR · Phase II

Award year

2004

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
K SYSTEMS CORP.
Proposal award date
2004-02-17
Contract end date
2006-02-17
UEI
Not reported
Solicitation number
2002.2
Topic code
OSD02-EP01

Research abstract

Aluminum Nitride (AlN)/Oxygen -Doped AlN (O-AlN) possess the unique properties of high dielectric strength, high resistivity, high decomposition temperature, chemical inertness, great hardness and excellent thermal conductivity. In Phase I, we demonstrated that AlN/O-AlN films can be deposited directly onto smooth aluminum surfaces with good adhesion, and that AlN/O-Aln films are highly flexible, making them suitable for the production of wound capacitors. The Phase II research will demonstrate an economical manufacturing technique using a dual magnetron sputtering system with a continuous rolling mechanism for the mass production of rolled capacitors, and will also demonstrate packaged AlN/O-AlN capacitors of high energy density, smaller size, and lower weight as compared to current film capacitors. The main objective of Phase II will involve the assembly and demonstration of a manufacturing operation which combines the AlN/O-AlN deposition system, and the capacitor rolling operation process into a single modular system housed within a 100 square foot area. The whole operation will be assembled within a clean room enclosure. This basic modular fabrication system could then be duplicated for the mass production of capacitors in the Phase III effort.

Technology keywords

Not reported

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Agency intelligence

Department of Defense

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