Instrumentation for Quantifiable Experimental Mechanics at the Deep Nanoscale

With the development of new nanostructured materials, there is an increasing need to quantify their basic properties. The small size scales of the materials complicate the adaptation of existing experimental approaches and require new instruments to perform basic measurements. This project will incorporate a fully-functional scanned-probe system into a sample holder for transmission electron microscopy (TEM), thereby permitting the complete range of versatile scanned-probe experimentation to be performed coincident with electron beam microcharacterization. The end result will be an instrument that permits the quantification of the mechanical response of materials at deep nanoscale levels of resolution. Phase I will involve the combination of high resolution probes with dynamic images of the internal structure of the sample via transmission electron microscopy (TEM). Commercial Applications and other Benefits as described by the awardee: The technology should lead to the implementation of a state-of-the-art hybrid system for quantitative surface property measurement and sample probing. This system would permit improved understanding of the interrelationship between materials processing methods and the resulting interplay between microstructure and properties.