SBIR/STTR Research Award

Automated Defect Analysis of Material Surface Defects

Award identifier 012bf3e2d66b4e07284577cf2a4f75629b78f1f3551f0b18f3f13a64f6e9b7a6Awarding agency Department of Defense · Air Force

Award amount

$72,428

Program and phase

SBIR · Phase I

Award year

1993

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
Materials Technologies Corporation
Proposal award date
Not reported
Contract end date
Not reported
UEI
MC9CPJ8DFPE3
Solicitation number
Not reported
Topic code
Not reported

Research abstract

Analysis of material surface defect plays an important role in the development of new materials and fabrication processes, and in the diagnosis of process problems in material manufacture. The task of manual defect analysis is labor intensive and tedious, and the level of automation available is limited. We propose to develop image processing techniques and a complete system to fully automate defect analysis. Features that quantify size, shape, orientation, and distribution of defects will be selected according to user needs. Algorithms for efficient computation of these defect features will be developed. Capability for graphic data display will be incorporated.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

48 SBIR/STTR records share this UEI (1988–2022). Reported award amounts total $11,941,405. Reported amounts are not federal obligations.

Phases: Phase I, Phase II

Agencies: Department of Defense, National Aeronautics and Space Administration, Department of Energy

Agency intelligence

Department of Defense

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