A Full Rotation Specimen Holder for State-of-the-art Tomography in a Transmission Electron Microscope

Three-dimensional electron tomography can render images of the internal structure of solid-state and biological materials at the nanometer scale, and is finding increased application in nanotechnology, semiconductor industries, and the life sciences. However, current systems cannot acquire all the information necessary to construct an optimal tomogram. A major limitation is that these systems do not allow the specimen to be imaged over a full ±90º tilt of the sample. This project will develop a new sample manipulation methodology that will allow the sample to be fully rotated. In Phase I, new hardware and software developed to perform a full rotation of a sample. Testing in a TEM with a simple sample produced promising results. Phase II will involve improving the hardware, developing software, and testing the technique with a variety of samples. Commercial Applications and other Benefits as described by the awardee: The new specimen holder should offer crucial advantages over existing market solutions ¿ including full rotation of the sample (thereby increasing the inherent resolution in the three-dimensional tomograms), positioning of the sample with high precision and accuracy, and direct compatibility with common sample preparation methodologies ¿ allowing scientists to produce the highest resolution tomograms yet seen