In-Situ Precision Reflectometer for ABL Coating Systems

This Small Business Innovative Research Phase I proposal seeks to develop a sensitive, in-situ coating metrology instrument that is capable of characterizing very low absorption (VLA) coatings during deposition. The new instrumentation will be capable ofrapidly and accurately determining the quality of VLA coatings in real time during the coating process. The Phase I research will determine feasibility for the system by demonstrating a bench top version of the core platform as well as identifyingsuitable subcomponents that will be required for the Phase II Prototype. The ability to measure and quantify critical optical parameters in high-energy infrared optics will be directly demonstrated, and the expected performance of the Phase II prototypewill be inferred from the Phase I results. The proposed instrument will assist in the development, quality control, and optimization of high-energy laser (HEL) optical components. The technology will impact government, military, and commercial sectors,providing a valuable new diagnostic capability for thin film coating systems.