High Resolution X-Ray Imaging Sensor for Real Time Nondestructive Evaluation

The advanced materials and sophisticated designs of metal matrix composite components are being used in modern aircraft designs. To detect flaws and other integrity-reducing anomalies in these new materials and to assure the component reliability and accurate failure rate predictions, nondestructive evaluation (NDE) using X-ray inspection is becoming indispensable. Currently used X-ray imaging sensors primarily limit both the ability of radiographic and computed tomographic (CT) procedures to produce high quality images and also scan times adequate to achieve real-time inspection throughput. Using conventional X-ray sensors, such as Tb2O3 scintillators, there exists a problematic tradeoff between the thickness and spatial resolution due to laternal light spreading. The scanning speed of these systems is further limited by persistence effects of the sensor. To address these needs, we propose to develop a novel, large area, microstructured scintillator plate to be incorporated into a CT/radiography imaging system based on a large area charge-coupled device currently used for NDE of aerospace components. This microstructured X-ray sensor suppresses lateral spreading of the scintillation light even when the structure is made very thick. For the X-ray sources typically used in nondestructive testing procedures, this sensor will provide high resolution with high detection efficiency together with fast scanning speed, allowing the full potential of NDE systems to be realized. OPTION TASK: None submitted.