In-Space Portable Multi-Functional Intelligent Evaluation Tool

To support NASA needs for in-space non-destructive evaluation (NDE) tools, Intellisense Systems, Inc. (Intellisense) proposes to develop a new small-size, lightweight, and battery-powered In-Space Portable Multi-Functional Intelligent Evaluation Tool (SMIET) based on Compton imaging tomography (CIT). SMIET’s innovative application of CIT for in-space in situ NDE provides three-dimensional (3D) visualization while its artificial intelligence enables true characterization of various defects/irregularities of in-space large multilayered components/structures with complex 3D geometries such as truss, stiffened, and welded and/or bonded structures fabricated using combinations of various aerospace materials including Inconel, titanium, aluminum, carbon fiber, thermoplastic composites, lunar regolith, and thermal blanket structures. SMIET performs volumetric NDE of space-based components/structures, estimates their in-depth integrity, and detects, identifies, and localizes defects/irregularities such as cracks, voids, delaminations, porosity, inclusions, micrometeoroid damages, and foreign object debris. SMIET can be used for the NDE of platforms on International Space Station and on planetary missions. Astronauts can use SMIET in a habitat or the space environment (i.e., on an extravehicular activity) or for automated inspection. In Phase I, Intellisense will demonstrate the feasibility of SMIET using a laboratory prototype, document SMIET’s ability to detect structural defects/irregularities in terms of resolution, sensitivity, and speed of operation. We will describe SMIET’s Phase II prototype and its application to the NDE of spacecraft components/structures. In Phase II, Intellisense will develop a full working prototype of SMIET along with plans for transition and commercialization. Intellisense expects the prototype to reach technology readiness level 6 by the end of Phase II.