SBIR/STTR Research Award

Direct etched silicon wafer surface activated bonding and vacuum sealing for Micro-Electromechanical Systems (MEMS) and devices.

Award identifier 1d6d1d9d66283fc0b9be13ab3196dd94e4238ec82304e3206ee63f487e0a7e28Awarding agency Department of Defense · Navy

Award amount

$139,998

Program and phase

SBIR · Phase I

Award year

2024

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Award details

Awarding agency
Department of Defense
Branch
Navy
Recipient company
BLUE WAVE SEMICONDUCTORS INC
Proposal award date
2023-12-05
Contract end date
2024-06-03
UEI
KTDJGRR8NL34
Solicitation number
23.2
Topic code
N232-116

Research abstract

Advance packaged electronics and defense power electronics require highly integrated MEMs, sensors, and power electronics.Ā Particularly, MEMS sensors are more frequently being considered as alternatives to conventionally machined sensors in order to meet performance requirements in a low size, weight, and power (SWaP) package. For advanced integrated MEMs manufacturing with high reliability, wafer bonding is an important and key technology that will allow 3D integration of devices. Wafer bonding can be used for integration of the electronic components with the mechanical, optical components, waveguides, mirrors in a single, wafer-level process step. However, wafer bonding with etched MEMs wafers brings new challenges due to very strict requirements in surface flatness, smoothness, geometrical constraints, complexity of the MEMS devices, process temperature and contamination. Currently, direct silicon wafer bonding is employed, however, it necessitates high standards in both surface geometry and roughness. Etched silicon wafers are often not considered for direct wafer bonding because of those standards. Adhesion layers, such as a eutectic metal layer, can overcome the stringent geometry standards required for direct bonding, but the thermal expansion (coefficient of thermal expansion (CTE)) mismatch between the adhesion layer and the silicon device will lead to performance impacts for high stability sensors, such as micro-cracking, long-term creep, and interface debonding. In this SBIR Phase I proposal, we address challenges identified and proposed innovative solutions for etched MEM wafer bonding. This will lead to further advance in the MEMs packaging technology. Our innovative approaches include development of desired surface processing conditions and bonding layers that can chemically, structurally, and thermally match to bonding substrate. Our method of integrating the technology is novel, unique and it will allow in-situ wafer bonding.Ā This technology could also be used for hermetic sealing/packing of MEMs mimicking additive manufacturing for direct wafer bonding. We have processing capabilities that are beyond standard commercial bonding tools available currently in the market. Our technology will present the Navy/DoD with an aggressive approach to produce very high-performance power electronics.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

12 SBIR/STTR records share this UEI (2002–2024). Reported award amounts total $3,602,614. Reported amounts are not federal obligations.

Phases: Phase I, Phase II, Phase II – Direct to Phase II

Agencies: Department of Defense, National Science Foundation

Agency intelligence

Department of Defense

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