Engineering Polycrystalline Perovskite for Low-Cost Pixelated X-Ray Imager

Chemelectronics LLC will team up with the University of California, Los Angeles to develop a low-cost solution processible polycrystalline all-inorganic perovskite CsPbBr3 integrated on silicon thin film transistor panel for pixelated X-ray imager. The project target is to demonstrate 10-100 keV x-ray energy range with detection sensitivity of >100 µC Gyair-1cm-2 at pixel size less than 100 micrometers. The proposed solution processible low-cost polycrystalline CsPbBr3 perovskite is inspired by their excellent carrier mobility and lifetime, as well as free of deep trap states. The demonstrated benefits of low-cost pixelated x-ray imager with polycrystalline CsPbBr3 perovskite include high resolution, sensitivity and stability. Furthermore, the use of low-cost polycrystalline CsPbBr3 perovskite materials and a solution-processed procedure will meet the cost target of < $0.5/cm3 for the x-ray active materials. During Phase I, the team will (1) identify the solution engineering process protocols for the low-cost polycrystalline CsPbBr3 perovskite and (2) carry out preliminary integration polycrystalline CsPbBr3 perovskite with silicon thin film transistor panel to characterize pixelated x-ray imager performance in sensitivity and operational stability. It is anticipated that multiple iterations will be required to optimize the engineering of polycrystalline CsPbBr3 perovskite to achieve high x-ray detection sensitivity. The engineering work will be carried out at Chemelectronics LLC, while the device integration and x-ray test will be done at UCLA.