LOW-COST PIXELATED X-RAY IMAGER

Large-area X-ray imaging is one of the most widely used imaging modalities that spans several scientific and technological fields. Even with its large number of applications, currently, there are no cost-effective X-ray imaging solutions available that can provide both high spatial resolution and quantum efficiency simultaneously. Current X-ray detectors are limited in efficiency (Si or a-Se based) and spatial resolution (scintillator-based) and cannot meet the current imaging demands. Under this SBIR program, we will develop and commercialize a low-cost highly scalable direct X-ray detector system using a high-Z perovskite semiconductor. The major tasks of phase I would be: (a) Sensor optimization, (b) Demonstration of X- ray sensitivity >>102 µC-Gyair-1-cm-2, and (c) Sensor deposition and characterization on an a-Si:H pixel array with pixel size <100µm. The high-sensitivity large format X-ray - Scientific and engineering products that are based on X-ray imaging techniques form the basis for many technologies that directly benefit the public, including non-destructive imaging for materials science and energy research cultural heritage investigations, metrology, and geophysics. High- efficiency direct X-ray detectors are also an indispensable tool for medical imaging. Enhancement of the X-ray sensitivity in the flat panel X-ray imagers and emergence of an economical semiconductor candidate for direct X-ray imaging will herald a transformational change in these applications.