Ultra-Low Liquid Helium Temperature In-Situ TEM Sample Holder

Scanning Transmission electron microscopy S/TEM) is primary characterization method used to determine nanoscale features and local internal structure of materials. However, conventional S/TEM observations are usually performed under conditions that are different from a material’s actual working environment. If electrical stimulus can be applied to the sample, then the relationship between structural properties and electronic properties can be investigated in-situ. Furthermore, if at the same time one subjects the sample to cryogenic temperatures during imaging at high resolution, one can explore the material processes involved in structural and electronic phase transformations as a result of electrical stimulus at these low temperatures - all the way down to LHe temperatures. The benefits of an in-situ S/TEM electrical system that can be controllably cooled to cryogenic temperatures as low as 4K are quite substantial. The development will accelerate in the study of quantum materials for real world applications such as cybersecurity, medicine, communications, financial services and transportation. The understanding of those quantum properties at the fundamental level had been difficult due to the limited techniques with inadequate spatial and temporal resolution. Therefore, in this Phase I project we aim to develop a single-tilt, a single-tilt, ultra-low T, highly stable liquid helium LHe) side entry STEM) holder that allows electrical stimulus to be applied to the sample while it is concurrently held at LHe temperature regime. In Phase II we will then develop a double-tilt, ultra-low temperature electrical biasing holder with robust temperature control system from below 4K to room temperature RT). and bring the product to market. The broader impact/commercial potential of this project will be the availability an in-situ TEM liquid helium cooling electrical biasing sample holder that will be key in enabling scientists to expand the knowledge of structure-property relationships in materials, specifically the relation between temperature and electronic properties, and will allow for the accelerated development of the next generation of quantum-inspired technologies. The development of new holder will also compliment recent advances in aberration-corrected TEMs and direct electron/pixelated cameras, enabling imaging of materials in real-time at higher spatial, energy and temporal resolution.