Photonic Integrated Circuit Reliability Prediction, Verification and Validation

Photonic Integrated Circuits (PICs) and Planar Lightguide Circuits (PLCs) are finding application in optical communication and sensor systems for both military and commercial applications. The reliability of PIC and PLC devices applicable to Department of Defense (DoD) avionics, sensors, and electronic warfare is largely unknown. Verification and validation of PIC and PLC device reliability is paramount to opening the door to technology transition opportunities with DoD programs. The proposing team will develop new and/or improve existing methodologies to determine PIC and PLC device reliability. In the process of defining reliability prediction, verification and validation methodologies, the team will study PIC/PLC failure mechanisms, focusing on effects resulting from integration, such as the influence of neighboring intra-chip devices. This program will generate PIC/PLC reliability prediction models, associated software tools and test methods such as Highly Accelerated Life Test (HALT) to verify and validate PIC/PLC reliability for use in military applications.