Portable and Automated Radiation Effects Test Structures for Advanced Technology Nodes

Micro-RDC will develop portable radiation effects test structures that scales to new process nodes. These structures will enable the investigation of the effects of radiation on the new technology from the material processing level as well as the circuit level. The production of the chosen structures and the development of software to extract the model parameters will form the framework. A suite of test structures will be developed which provide data that can be used to create the model parameters with coverage for the variety of transistor geometries commonly used in the process. This effort will focus on generating the correct structure and structure sizing to provide electrical characterization over Total Ionizing Dose and Single Event Effects. The extracted parameters from the chosen test structures will allow for the construction of accurate simulation models. Subscribers will be able to predict radiation effects without having to run expensive test chips. This effort will appeal to programs needing efficiency in schedule and budget for aerospace end users. Due to the expense of advanced nodes, the cost savings represented by program developed technology will have a significant licensing demand. The licensed technology will be provided as an extension to the Foundry PDK.