Hierarchical, Layout-Aware, Radiation Effects Tools Vertically Integrated into an EDA Design Flow for Seamless Rad-Hard by Design

Reliable MicroSystems (aka RMS or Rel-Micro) has completed a Phase 2 STTR effort entitled “Hierarchical, Layout-Aware, Radiation Effects Tools Vertically Integrated into an EDA Design Flow for Seamless Rad-Hard by Design.”  We have developed an automated radiation-aware analysis suite fully integrated within the Cadence EDA ecosystem for mil/aero applications.  This capability, called VIRAD – Vertically Integrated Radiation Aware Design, was created to: enable first-pass success in radiation-hardened-by-design (RHBD) integrated circuit (IC) implementation is enabled by design tools that predict radiation failures (and optimize design techniques) prior to fabrication, expose RHBD ASIC design to the power of commercial EDA optimization, validation, and consistency, and improve the accessibility of new technology nodes to the DoD with the best chance at first-pass rad-hard design success and risk reduction. VIRAD 1.0 is complete and in beta testing.  All technological and engineering goals for the Phase 2 STTR program were reached.  A final report has been delivered and approved. However, in developing this resource, and in consultation with the target community, it has become clear that additional capabilities are appropriate and would be well received by the Defense Industrial Base (DIB).  Therefore, we suggest a follow-on effort to continue development of this RHBD capability toward VIRAD 2.0.