SBIR/STTR Research Award
High Density Semi-Auto Closed Cycle Cryoprober
Award amount
$99,979Program and phase
SBIR · Phase IAward year
2016Award details
- Awarding agency
- Department of Commerce
- Branch
- National Institute of Standards and Technology
- Recipient company
- MICROXACT INC.
- Proposal award date
- 2016-08-01
- Contract end date
- 2017-01-31
- UEI
- TKKMJWZJC2W5
- Solicitation number
- 2016-NIST-SBIR-01
- Topic code
- 9.01.04
Research abstract
High density wafer scale cryogenic probing solution for testing at 4.5K temperatures or below is needed for testing and characterization of devices and circuits employing superconducting electronic components (such as used for quantum processing, high speed classical processing, magnetic field sensors, etc.) as well as for testing of various particle and light detectors for astronomy, aerospace, defense and homeland security applications. MicroXact Inc. will develop a semi-automated, closed cycle, wafer scale high density cryogenic probe station for testing at below 4.5K to 300K or higher. In Phase I MicroXact will finalize the performance specifications, will develop mechanical model and design, and will verify system performance via simulations.
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Development of Versatile Wafer Probe System for High Power Devices
- Development of Versatile Wafer Probe System for High Power Devices
- Macroporous Si Particle Collimator
- Wide Energy Range X-Ray Neutral Density Filters
- Macroporous Si Particle Collimator
Research funding history
25 SBIR/STTR records share this UEI (2009–2025). Reported award amounts total $8,900,811. Reported amounts are not federal obligations.
Phases: Phase I, Phase II
Agencies: Department of Defense, National Aeronautics and Space Administration, Department of Energy, Department of Commerce