Integrated Circuit Authentication and Reliability Tool and Techniques

ABSTRACT: The objective of this proposal is to demonstrate the feasibility of designing, implementing and producing novel low-cost, easy to use, microsystems for authentication and end-of-life prediction of integrated circuits undergoing a die extraction and reassembly (DER) process.The significance of this proposal is the possibility of developing novel solid-state nanoionic based Combating Die and IC Recyclingstructures and devices that will be available to provide enhanced trust in the electronic supply chain of devices undergoing DER in the DoD but also for common microcircuits in the DoD and in any supply chain that requires enhanced trust and security for its microelectronics circuits, i.e. avionic, space, automotive, medical.The proposed/envisioned solution takes advantage of nanoionics properties of chalcogenide materials, and will be implemented as a novel nanoionic solid state microsystem to be inserted in the cavity of a microelectronic package with another die/IC that underwent DER in order to be inserted in a military approved package. Such nano-ionic microsystem will be able to let the user of the microcircuit know, once repackaged, if it has been used (powered-ON) and also for how long it has been used since DER by a simple electrical test/query of dedicated test pins on the package.; BENEFIT: Anticipated control of the growth-rate of the electrodeposits will be of immediate use for implementing CDIR circuits for ICs undergoing a DER process within the DoD supply chain, but also for other industry supply-chains requiring anti-counterfeit solutions. The phase I effort not only will demonstrate the capability of creating CDIR stand-alone microcircuits, but will also open the possibility of integrating such structures in new designs as the materials and processing techniques allow for integration on CMOS processes. Additionally, there are also application beyond the integrated circuit application: they could be used for CDIR and run time estimation of PCB used in electrical system, and also in additional systems in industry as the chalcogenide material have been shown to be implementable on flexible substrate, which would allow them to be implemented around pipes or other structures.The Phase I study will already result with significant progress in meeting the overall objectives of the program since both controllable electrodeposit growth-rate andmobile/bench-top characterization system will be demonstrated in actual laboratorytests. This level of progress is not typical for a SBIR Phase I study.The progress expectations are based on the facts that Alphacore and ASU already have developed and fabricated similar fully functional nanoionic components, and are experienced in tester system design.The total cost of the employment of counterfeit electronics can be estimated as billions of dollars in the USA alone. The issue of counterfeit electronics is growing and while there is a critical need for CDIR devices in the DoD supply chain, the need is also imminent for other high-reliability electronic industries, such as medical, aerospace and automotive industries.