SBIR/STTR Research Award

Radiation Hardened GaN Monolithic Integrated Circuits for Power Conversion

Award identifier b5004859abdb388c3c99fa275b9fe10aa819c66854c349e2bff55f50a4e340caAwarding agency Department of Defense · Navy

Award amount

$139,922

Program and phase

SBIR · Phase I

Award year

2025

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Award details

Awarding agency
Department of Defense
Branch
Navy
Recipient company
Alphacore, Inc.
Proposal award date
2025-08-01
Contract end date
2026-01-28
UEI
CXMPDDLFBCH3
Solicitation number
25.1
Topic code
N251-067

Research abstract

The desire for smaller and more efficient power and radio frequency (RF) devices has led the electronics community in the direction of wide band gap power devices. Gallium Nitride (GaN) High-Electron Mobility Transistor (HEMT) devices offer improvements in size, weight, and power (SWaP) over silicon transistors. Enhanced capabilities and SWaP reductions are desirable for DoD and Space system deployments. The Navy SBIR topic N251-067 ìRadiation Hardened Gallium Nitride Electronicsî sets objectives to characterize GaN devices and develop techniques to design radiation hardened (rad-hard) GaN electronics for power and/or RF applications. Additional objectives include the development of radiation hardened discrete GaN HEMT devices and radiation hardened GaN integrated circuits for power conversion and/or RF applications.ÝCommercially available GaN HEMTs have been demonstrated to show sensitivity and permanent damage due to exposure to radiation, specifically heavy-ion radiation while the part is biased. This radiation-induced damage is a significant concern for mission-critical applications. Additionally, many GaN HEMT and integrated circuit (IC) products face supply chain uncertainty through an evolving GaN manufacturing landscape and fabrication facilities that are not domestic to the continental United States (CONUS). It is highly desirable to develop radiation hardened by design (RHBD) GaN HEMT and integrated circuit solutions, to mitigate radiation effects damage and performance degradation, within a fabrication flow with a path to Defense Microelectronics Activity (DMEA) certified trusted status.ÝIn response to the DoD topic N251-067, Alphacore will develop a radiation-hardened, monolithic enhanced-mode (e-mode) GaN HEMT and gate driver/controller, fully GaN-based power management integrated circuit (ìMonolithic eGaN + Driver + Control PMICî for short) fabricated in a foundry domestic to the continental US. Current power management solutions are not radiation-hardened and use multiple integrated circuits (ICs) designed with different processes, typically using silicon (Si) CMOS ICs for logic and GaN discrete field-effect transistors (FETs) for power. This results in bulky solutions, typically not immune to high level radiation. The Alphacore competitive advantage includes radiation-hardness, compactness, high efficiency, high reliability, and US-based manufacturing in a DoD trusted foundry.Ý

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

155 SBIR/STTR records share this UEI (2013–2026). Reported award amounts total $63,784,604. Reported amounts are not federal obligations.

Phases: Phase I, Phase II, Phase II – Direct to Phase II

Agencies: Department of Defense, National Aeronautics and Space Administration, Department of Energy, Department of Commerce

Agency intelligence

Department of Defense

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