An Embedded Health Monitoring System for Determining Readiness of Electronic Components

Nokomis ultra-sensitive radio frequency (RF) sensor, the Hiawatha System, can leverage changes in unintended emissions signatures to monitor the overall state of electronic device health. As a device ages, emissions signatures change in a predictable and deterministic manner, enabling reliable determination of device readiness. Under this effort, Nokomis proposes to leverage hand-held embedded health monitoring (EHM) technology in tandem with an in situ front end that measures changes in low level RF emissions. The device will employ micro-electro-mechanical systems (MEMS) sensors for measuring environmental conditions to which the device has been exposed. The front end will provide information about environmental extremes to which the device was exposed utilizing MEMS technology, as well as measure RF emissions signature emanating from the device, providing a unique means of assessing device health via changes in these RF emissions. Embedded health (EH) data will be reported to personnel through a hand-held data processing device that personnel will be able to connect to the front end to retrieve EH data. Nokomis STTR partner for this effort, the University of Maryland Center for Advance Life Cycle Engineering (CALCE), brings decades of EHM expertise and a vast history of research and development of MEMS devices. Approved for Public Release 15-MDA-8161 (11 March 15)