SBIR/STTR Research Award

The Characterization and Mitigation of Radiation Effects on Nano-technology Microelectronics

Award identifier d42964deeaa5d825d07fe3fb490e6237731c43925a6f4f0e0ea2493506ef8c10Awarding agency Department of Defense · Defense Threat Reduction Agency

Award amount

$99,997

Program and phase

SBIR · Phase I

Award year

2009

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Award details

Awarding agency
Department of Defense
Branch
Defense Threat Reduction Agency
Recipient company
ROBUST CHIP INC.
Proposal award date
2009-02-17
Contract end date
2009-09-16
UEI
JULENP47NM44
Solicitation number
2008.2
Topic code
DTRA082-001

Research abstract

Robust Chip Inc. (RCI) and Stanford University (Stanford) propose a project with two main parts: 1. Exploration and development of a combined layout and circuit design methodology for complete protections against both single and multiple single event errors with a minimal circuit and layout overhead. 2. Extension of a unique, combined circuit-substrate, modeling technique for radhard design in ultra-deep submicron silicon technology, to support the development of radhard-by-design (RHBD) layout and circuits.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

7 SBIR/STTR records share this UEI (2005–2012). Reported award amounts total $2,894,510. Reported amounts are not federal obligations.

Phases: Phase I, Phase II

Agencies: Department of Defense

Agency intelligence

Department of Defense

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