Low Cost InGaN Device Production and HOVPE Tool
Award amount
$99,000Program and phase
SBIR · Phase IAward year
2009Award details
- Awarding agency
- Department of Defense
- Branch
- Defense Advanced Research Projects Agency
- Recipient company
- STRUCTURED MATERIALS INDUSTRIES, INC.
- Proposal award date
- 2009-02-05
- Contract end date
- 2009-09-30
- UEI
- WMLSF59AE7E1
- Solicitation number
- 2008.2
- Topic code
- SB082-053
Research abstract
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- SiC Low Gain Avalanche Diode (LGAD) for Minimum Ionization Particle (MIP) sensors
- Optimal Radiation Tolerant High Intensity High Temperature Photovoltaics
- Large Area InGaN/GaN MQW p-i-n Avalanche Photodiode Cherenkov Radiation Detectors
- High Performance High Current CW polarized photocathodes for Electron Ion Colliders
- Innovative Equipment Large Single Crystal CdZnTe Production for Long-Wave Infrared Detector Arrays
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Low Cost InGaN Device Production and HOVPE Tool
- Low-cost device relevant Indium Gallium Nitride (InGaN) or Alternatives
- HVPE-grown InGaN Materials for Aggressive Cost Reduction of Solid State Lighting Technologies
Research funding history
177 SBIR/STTR records share this UEI (1992–2024). Reported award amounts total $45,517,958. Reported amounts are not federal obligations.
Phases: Phase I, Phase II
Agencies: Department of Defense, Department of Energy, National Aeronautics and Space Administration, National Science Foundation, Department of Commerce, Department of Homeland Security