HIGH TEMPERATURE SURFACE EMISSIVITY MEASUREMENT SYSTEM

SURFACE OPTICS CORPORATION PROPOSES A STUDY PROGRAM LEADING TO THE DEVELOPMENT OF A BENCH-TYPE EMISSOMETER CAPABLE OF MEASURING THE NORMAL SPECTRAL EMISSIVITIES OF METALLIC AND NON-METALLIC MATERIALS IN THE WAVELENGTH REGION FROM 0 TO 10 MICROMETERS, AND OVER A TEMPERATURE RANGE FROM 2000 TO 5000 DEGREES R. THE SYSTEM IS INTENDED TO GENERATE A SURFACE PROPERTY DATA BASE FOR THE DETERMINATION OF TEMPERATURES ENCOUNTERED IN HYPERSONIC WIND TUNNEL, ARC TUNNEL AND TEST RANGE EXPERIMENTS. PHASE I OF THE PROPOSED PROGRAM WILL CONSIST OF AN ASSESSMENT OF PRIOR ART CONTAINED IN BOTH THE DOMESTIC AND FOREIGN LITERATURE, AN EVALUATION OF THE TECHNOLOGY EMBODIED IN CURRENTLY OPERATIONAL TEST FACILITIES, A CRITICAL ASSESSMENT OF VARIOUS DESIGN CONCEPTS, AND FINALLY, THE FORMULATION OF AN OPTIMUM DESIGN OF A BENCH-TYPE INSTRUMENT SUITED FOR LABORATORY USE. THE AVAILABILITY OF COMPONENT SUCH AS A 3000 DEG K BLACKBODY, A PERKINELMER SPECTROPHOTOMETER, AND TRANSFER OPTICS ON THE PREMISES OF THE SURFACE OPTICS CORPORATION OFFERS THE OPTION OF VERIFYING THE PROPOSED SYSTEM IN A BREADBOARD VERSION.