Portable Emissivity / Reflectometer for Measurements on Curved Surfaces

"This effort will first recognize the broad requirements based on the physical and optical properties of objects identified by the Navy. The design of the instrument requires full understanding of the shapes of the objects, optical and spectroscopicproperties of the coating materials, and their sensitivity to heat. This part will be conducted in close collaboration with the Navy. The next step will be to apply the knowledge gained to evaluate the reflectometers currently available from SurfaceOptics Corporation. Surface Optics developed two portable instruments which measure reflectance: the SOC 600, which measures BRDF and the SOC 400T, which measures directional reflectance. The SOC 400T is a prototype, which was built for and delivered toNASA. For reasons discussed further we believe that the SOC 400T can become a starting point for the development of the desired instrument. The development will be done in close collaboration with the Navy and will strictly implement the conclusions ofthe established comprehensive Navy requirements. If the general concept of measuring directional reflectance applied in the SOC 400T is acceptable, then it can be implemented in two possible ways. It can be developed into another accessory for the SOC400 FTIR reflectometer, or as an accessory for possibly a more rugged and smaller spectrometer with compromised spectral resolution and sensitivity. The emissivity measurement tool has a broad p