IN SITU OPTICAL PROPERTY MEASUREMENT SYSTEM

SURFACE OPTICS CORPORATION PROPOSES A STUDY PROGRAM LEADING TO THE DEVELOPMENT OF A PORTABLE REFLECTOMETER SUITED FOR IN SITU MEASUREMENTS OF SURFACES UNDER FIELD CONDITIONS, SUCH AS THOSE OF AIRCRAFT, ARMORED VEHICLES, BUILDINGS AND BACKGROUND OBJECTS. THE INSTRUMENT IS ENVISIONED TO CONSIST OF A CONTROL STATION AND ONE OR MORE MEASUREMENT HEADS TO PROVIDE THE HEMISPHERICAL EMITTANCE AND BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION (BRDF) OVER THE WAVELENGTH RANGE FROM 2.0 TO 9.0 MICROMETERS. THE INSTRUMENT WILL BE AUTOMATED AND CONTROLLED BY A COMPUTER LOCATED IN A CONTROL STATIONS. PHASE I OF THE PROPOSED EFFORT WILL FOCUS ON THE CONCEPTUALDESIGN OF THE INSTRUMENT, THE RESOLUTION OF TECHNICAL PROBLEMS, AND ON AN EVALUATION OF TRADEOFFS. WHILE THE DESIGN OF THE BRDF INSTRUMENT MEASUREMENT HEAD IS STRAIGHTFORWARD AND MAY BE ADAPTABLE FOR HEMISPHERICAL EMITTANCE MEASUREMENTS, THE LATTER MAY BE MORE READILY ACCOMPLISHED BY A SEPARATE HEAD. OTHER TRADEOFFS INVOLVE THE QUESTION OF WHETHER TO MEASURE EMITTANCE DIRECTLY, OR MEASURE REFLECTANCE AND DERIVE HEMISPHERICAL EMITTANCE THEREFROM. PHASE I WILL CONCLUDE WITH THE PREPARATION OF A FINAL REPORT, INCLUDING DRAWINGS AND A FABRICATION PLAN FOR PHASE II.