A High-Resolution Transverse Diagnostic Based on Fiber Optics

As electron beam generation and transport technologies progress, producing higher brightness beams, more advanced methods to validate beam properties are required. This challenge is compounded for test systems that have low beam energies, complex beam profiles and, often, the need to insert diagnostics immediately before or after an interaction point. This project will develop a diagnostic that utilizes technological advances in fiber optic manufacturing to construct a micron-resolution beam profile monitor. The proposed fiber-optic profiling device will provide a turn-key solution with minimal operational supervision, require minimal beamline real estate, and provide micron-level resolution. Phase I will simulate and design the fiber-based transverse beam imaging system. Commercial Applications and other Benefits as described by the awardee: The resulting product should be readily available for implementation by research laboratories, thus incrementally improving the tools available to light sources and high brightness beam facilities. The scintillating fiber ribbons, which underlie this technology, could be applicable to x-ray imaging, medical imaging, non-destructive testing, and possibly security applications.