Magnetic Tunnel Junction Nanoprobe Compatible with an Atomic Force Microscope

The burgeoning field of nanotechnology is limited by our ability to image and manipulate matter at extremely small length scales. As this field progresses, new tools and methods are needed to allow scientists and engineers to understand and control nanoscale systems. This project will create a high-sensitivity, microscopic magnetic tunnel junction sensor that will be capable of measuring tiny magnetic fields at the nanoscale. To do this, previous work in magnetic tunnel junction technology will be applied to a micromachined nanoprobe that is compatible with the well-known technique of atomic force microscopy. The sensor will be able to measure electromagnetic properties at high frequencies and with excellent spatial resolution. Commercial Applications and other Benefits as described by the awardee The new magnetic nanoprobe would allow scientists and engineers to study magnetic materials, as well as the flow of electrical current, at nanometer length scales. This capability should have applications for testing and diagnostics in the semiconductor and recording industries.