Measuring Extreme Thermal Conductivity Ranges using Infrared Components (METRIC)

This Phase I STTR project aims to conduct feasibility study and establish the design of a temperature-dependent (25-225 °C) thermal conductivity measurement system based on the framework of Steady-State Thermoreflectance in Fiber (SSTR-F). The system will produce highly accurate (± 5%) and reproducible (± 1%) measurements of the thermal conductivity from 0.1 W?m-1?K-1 to 2000 W?m-1?K-1 in both thin films and bulk substrates of wide bandgap semiconductors, as well as thermal boundary resistance in the 1-100 m2·K/GW range across semiconductor interfaces at the wafer scale. The fiber-optic design ensures no optical maintenance or alignment of laser paths to ensure day-to-day repeatability and accuracy when operated by different users. During the Phase I project, the goal is to achieve the following technical objectives: 1) determine limits to commercial state-of-the-art measurement capabilities; 2) identify system design requirements via modeling and simulation; 3) design the system and select components; 4) demonstrate feasibility to measure extreme thermal conductivities at room temperature; 5) demonstrate feasibility to measure extreme thermal conductivities from 25-225 °C; 6) design user experience and software for automation, leveraging artificial intelligence and machine learning for data acquisition and analysis.