NexGen Electro-Explosive Ordnance Device with Built-in-Test (BiT)

In the Phase I, Tanner Research designed, developed, and demonstrated an EED (electro-explosive device) with self-test logic in bench-top hardware. This EED with Built-in-Test (BiT) functionality leveraged Tanner Research"s core TRL-7 IM-compliant exploding foil initiator (EFI) and fireset technology which is capable of initiating next generation (NexGen) energetics. NexGen energetics are absolutely required for reliably initiating the in-line insensitive energetics and transitioning to Insensitive Munition(IM) compliance. In Phase II, Tanner Research and its principal teammate, will develop a Built-in-Test (BiT) MIL-STD-1901A Solid Rocket Motor/Through-Bulkhead Initiation (SRM/TBI) device. The planned MDA EAFD form factor which consists of MIL-STD 1901A compliant fireset, BiT circuitry, and dual detonators is highly compact. In parallel with delivering a pre-production EAFD with BiT, Tanner Research will investigate specific energetic health monitoring modalities to improve in-situ energetic failure prediction and lifetime assessment. Approved for Public Release 14-MDA-7903 (2 July 14)