Wafer-level Short Wave Infrared (SWIR) Micro-Camera

This proposed effort focuses on the development of a short wave infrared (SWIR) micro-camera that is capable of identifying targets at ranges of 100 to 1000 meters with a 40 degree field of view, through a collaborative effort between the proposing small business Episensors, Inc. and BAE Systems. Innovative materials and device processing methods developed by the Episensors, Inc. team will allow high performance, low cost HgCdTe detectors to be employed to improve performance over conventional InGaAs detector-based systems while maintaining or reducing detector cost. By utilizing HgCdTe detectors, the camera system developed in this effort will be able to image from 0.8 & #61549;m to 2.5 & #61549;m, while InGaAs detectors are unable to image efficiently above 1.7 & #61549;m. This will allow the proposed system to collect additional signal from both blackbody thermal radiation and nightglow, which will improve the functionality of the camera system. Camera costs will further be reduced by utilizing innovative 3D component integration and wafer-scale optics manufacturing, with a targeted reduction in cost of 10x over traditional SWIR camera systems. These integration and manufacturing process will also allow for an unprecedented fully integrated camera system size of 20 cm3 to be achieved.