SBIR/STTR Research Award
Traps with Annular Geometries for Identifying Tampering (TAGIT)
Award amount
$99,983Program and phase
SBIR · Phase IAward year
2011Award details
- Awarding agency
- Department of Defense
- Branch
- Army
- Recipient company
- NEXGENSEMI CORPORATION
- Proposal award date
- 2011-02-15
- Contract end date
- Not reported
- UEI
- GQSJQMBAEJ79
- Solicitation number
- 2010.2
- Topic code
- OSD10-A09
Research abstract
NexGenSemi Corporation (NGSC) is proposing to OSD to develop novel Traps with Annular Geometries for Identifying Tampering (TAGIT) detection scheme. The sensor system is comprised of both an on-chip passive device that produces variation in preset charge distributions resulting from increased free carrier mobility and recombination processes induced by interactions with energetic photons, charged particles, and thermal excitations introduced during reverse engineering efforts or malicious wafer modifications after initial fabrication
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Additive Manufacturing Rad Hard Microshields (AMRM)
- Advanced Microelectronic Manufacturing Program (AMMP)
- 3D Printed Microscale Radiation Shield
- Resonating Acoustic Vector Integrated Nanoribbon (RAVIN)
- Materials and Life Cycle Sustainability
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Zero Power/Ultra Low Power Tamper Detection Sensors
- Zero Power/Ultra Low Power Tamper Detection Sensors
- Zero Power/Ultra Low Power Tamper Detection Sensors
- Photo-Responsive Conductive Materials for Anti-Tamper Sensors
- Near-Field Transducing Plasmonic Detector (NTRAP)
Research funding history
13 SBIR/STTR records share this UEI (2009–2023). Reported award amounts total $3,518,921. Reported amounts are not federal obligations.
Phases: Phase I, Phase II
Agencies: Department of Defense