Efficient and Accurate Coupled Circuit and Substrate Simulation for Radiation Hard Electronics
Award amount
$95,831Program and phase
SBIR · Phase IAward year
2005Award details
- Awarding agency
- Department of Defense
- Branch
- Defense Threat Reduction Agency
- Recipient company
- ROBUST CHIP INC.
- Proposal award date
- 2005-08-02
- Contract end date
- 2006-01-02
- UEI
- JULENP47NM44
- Solicitation number
- 2005.1
- Topic code
- DTRA05-001
Research abstract
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Solutions for Single-Event Effects in Ultra Deep Submicron Semiconductor Technologies Using Simulation and Layout Techniques
- Solutions for Single-Event Effects in Ultra Deep Submicron Semiconductor Technologies Using Simulation and Layout Techniques
- Single Event Transient Effects for Sub-65 nm Complementary Metal-Oxide Semiconductor (CMOS) Technologies
- The Characterization and Mitigation of Radiation Effects on Nano-technology Microelectronics
- The Characterization and Mitigation of Radiation Effects on Nano-technology Microelectronics
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Efficient and Accurate Coupled Circuit and Substrate Simulation for Radiation Hard Electronics
- Improved Mixed-Mode Simulation Tools for Radiation Hardening of Nanoscale Semiconductor Integrated Circuits
- HIGH EFFICIENCY COMPACT MODELING OF RADIATION EFFECTS
- Radiation Effects in Semiconductor Electronics
- Radiation Effects in Semiconductor Electronics
Research funding history
7 SBIR/STTR records share this UEI (2005–2012). Reported award amounts total $2,894,510. Reported amounts are not federal obligations.
Phases: Phase I, Phase II
Agencies: Department of Defense