SBIR/STTR Research Award

Manufacturng Process for Production of Doped GaN Crystals

Award identifier cfc8ca23643660e5ca95913d5cabdfb6e2bb555afab810bd60952bc2dbbaf7f2Awarding agency Department of Defense · Missile Defense Agency

Award amount

$70,000

Program and phase

SBIR · Phase I

Award year

2003

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Award details

Awarding agency
Department of Defense
Branch
Missile Defense Agency
Recipient company
KYMA TECHNOLOGIES, INC.
Proposal award date
Not reported
Contract end date
Not reported
UEI
GDV6R1VLRVN7
Solicitation number
Not reported
Topic code
Not reported

Research abstract

Kyma Technologies will use its proprietary manufacturing technique for growth of bulk GaN doped substrates. We propose to develop gallium nitride (GaN) substrates with n- and p- type dopants for device fabrication. Attempts to grow low defect densitygallium nitride (GaN) thin films on substrates such as sapphire and silicon carbide (SiC) have had limited success. As such, homoepitaxial GaN thin film growth is of great interest. GaN wafers manufactured by Kyma Technologies will be used as the seed forgrowing doped GaN crystals. Doped GaN wafers will be useful in developing various types of microelectronic and optoelectronic devices. The limiting factors in many high performance applications based on GaN and related materials can be attributeddirectly to material defects in epitaxially grown layers. The development of a low defect density doped GaN substrate will result in improved properties of epitaxial GaN films, and subsequently will improve the performance of GaN-based devices. Achievinglow defect density, free standing GaN layers will enable many of these technologies to be commercialized. Single crystal gallium nitride will be the future building block for many commercial devices. Low defect density gallium nitride films will benefitmany microelectronic and optoelectronic devices. This material will lead to the commercialization of blue lasers in data storage and solid state white LED lighting. Homoepitaxial growth of gallium nitride on single crystal gallium nitride substrates willresult in improved device performance such as increased lifetime and brightness in optoelectronics and increase power and frequency in microelectronic devices.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

83 SBIR/STTR records share this UEI (2000–2024). Reported award amounts total $34,128,798. Reported amounts are not federal obligations.

Phases: Phase I, Phase II, Phase II – Direct to Phase II

Agencies: Department of Defense, Department of Energy, National Aeronautics and Space Administration

Agency intelligence

Department of Defense

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