Ultra-High Voltage Reliability Test System

Hyperion Technology Group, Inc. (HTG), with Research Institution (RI) partner Advanced Controls & Energy Systems (ACES) Research Laboratory at the University of Alabama, propose a Phase I SBIR effort to significantly advance the testing capabilities for prototype Ultra-High Voltage (UHV) Wide Bandgap (WBG) semiconductor devices. This development is essential for the enhancement of next-generation device production and quality control, addressing a gap in current commercial test equipment capabilities. Focused on bulk testing packaged devices, the initiative is pivotal for mid-volume production of future prototype devices. The capability focus for this tester is package reliability tests such as HTGB, HTRB, H3TRB, and ALT-HTRB. But the tester would be fully programmable, and capable of accommodating new test protocols within the technical limitation of the system. We propose the development of a UHV reliability tester capable of operating at high voltage levels, up to 40 kV. The system will accommodate up to eighty (80) devices simultaneously, based on the overall size of the packaged device. The proposed schema will be based on modular elements and extensible to future test protocols and package types and the needs of the DMEA evolve.  Our team will develop a complete technical data package, informed through Finite-Element Analysis (FEA) and prototyping of key components, where applicable. Phase II would provide for the development of a turn-key prototype system for extended on-site test and evaluation.