Aging and Reliability Module ( ARM)

The U.S. Navy’s Strategic Systems Programs (SSP) operates some of the most technologically sophisticated weapon systems ever produced. Those systems are 100% dependent on modern advanced electronics. There are major challenges in available reliability assessment approaches to address the reliability of modern electronic devices used in these systems. SSP’s SBIR solicitation sought innovative advanced technology with real-time capability to support measuring aging effects and predictive degradation analysis on electronic piece parts. This Phase II proposal leverages Nokomis’ existing Advanced Diagnostics of Electronic Components (ADEC) system and focuses on the development of an Aging and Reliability Module (ARM). ARM will deliver unique and unparalleled capability to detect aging via radio frequency (RF) signature changes that correlate directly to aging mechanisms in support of SSP real-time component reliability assessment needs.   The Nokomis developed TRL 9 ultra-sensitive ADEC system measures degradation of electronic components through assessment of RF spectrum metrics. ADEC’s sensitivity of -170 dBm is uniquely capable of detecting small signature changes that provide breakthrough capabilities in this area. ADEC’s modular software architecture facilitates a seamless integration of the ARM for SSP. The ADEC-ARM capability will provide a framework for:  Real-time radiation hardness degradation assessments  Assessments of aging on the piece part and board level  Actionable Condition Based Maintenance (CBM)  Remaining Useful Life (RUL) prognostication