Modeling of Radiation Effects for EO/IR Systems with Unintended RF Emissions

Nokomis is a leader in understanding and correlating unintended Radio Frequency (RF) emissions to device health of electronic components. Nokomis has been able to detect degradation effects on electronic components before typical life tests. Nokomis has understood electronic health degradation due to age on multiple levels from specific piece part function to isolation of part failure on the board and integrated system level. Nokomis is proposing to systematically expose Electro-Optic/Infrared (EO/IR) sensors to radiation dose rates and measure the resulting RF emissions to develop a database of failures that can be correlated to specific components and devices. The end goal of the project will be to provide a simulation system that will understand at the functionality level how a sensor will survive radiation exposure and which components in the device are most susceptible. Approved for Public Release | 22-MDA-11215 (27 Jul 22)