Remaining Useful Life

As the technological complexity of United States Air Force (USAF) platforms continue to evolve and high-performance electronics become increasingly more crucial to achieve mission objectives, the reliability of all electronic components becomes essential. Mission-critical electronic components require exceptional operational reliability to ensure high confidence mission completion. Components, such as microprocessors, Programmable Logic Devices (PLDs) including Field Programmable Gate Arrays (FPGAs), Application-Specific Integrated Circuits (ASICs), munitions fuzes, memory and a myriad of other components are vulnerable to environmental and operational stresses which contribute to natural part degradation over time. Electronics degrade over their lifetime becoming more susceptible to reduced performance, increased faults, and eventual failure. Rapid progress in the microelectronics field often outpaces the development of new defense systems. This is exacerbated by increasingly long weapon system lifecycles, that increases component exposure to environmental and operational risk factors, thereby increasing failure rates and maintenance costs. These failures can be mitigated with device measurement technology that can quickly determine the device’s health state. However, there is currently no robust solution which assesses component health and Remaining Useful Life (RUL). The ability to determine the health of electronic components and accurately report their health is a known critical gap for maintenance and operational assurance. Nokomis’ Remaining Useful Life Assessment Suite (RULAS) addresses that capability gap. Electronics degrade over their lifetime becoming more susceptible to reduced performance, increased faults, and eventual failure. Rapid progress in the microelectronics field often outpaces the development of new defense systems. This is exacerbated by increasingly long weapon system lifecycles, that increases component exposure to environmental and operational risk factors, thereby increasing failure rates and maintenance costs. These failures can be mitigated with device measurement technology that can quickly determine the device’s health state. However, there is currently no robust solution which assesses component health and Remaining Useful Life (RUL). The ability to determine the health of electronic components and accurately report their health is a known critical gap for maintenance and operational assurance. Nokomis’ Remaining Useful Life Assessment Suite (RULAS) addresses that capability gap.