SBIR/STTR Research Award
Methodologies to Develop Radiation Testing Environments for Survivable Microelectronics (STTR)
Award amount
$149,817Program and phase
STTR · Phase IAward year
2022Award details
- Awarding agency
- Department of Defense
- Branch
- Missile Defense Agency
- Recipient company
- NOKOMIS INC
- Proposal award date
- 2021-12-06
- Contract end date
- 2022-06-05
- UEI
- YAPUZLNJ1856
- Solicitation number
- 21.B
- Topic code
- MDA21-T001
Research abstract
Nokomis is proposing to use Radio Frequency (RF) technology to characterize the effects of different radiation environments on electronic components. Nokomis has created and matured an ultra-sensitive RF sensor, the Advanced Diagnostics of Electronic Components (ADEC) system to characterize electronics via Electromagnetic (EM) emissions. ADEC functions as a multifaceted tool, specifically to characterize and identify the emission signature related to a specific electronic device or system, as well as the state or functionality of the component. In this proposal Nokomis will use ADEC to detect differences in electronic components based on the type of radiation and total ionizing dose (TID). By classifying the characteristics of the EM emissions Nokomis will correlate RF signature characteristics with radiation exposure effects. Approved for Public Release | 21-MDA-11013 (19 Nov 21)
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- “Left of Launch” Indications and Warning for Enhanced Battle Management
- Noise Masked Communication System (NMCS)
- Nokomis Expeditionary Space Domain Awareness (NExSDA) System
- Passive RF-Based Target Detection, Identification, and Geolocation for RF Seekers
- Hiawatha Passive RF Threat Detection and Identification System
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Radiation Survivability Assessment Method (RSAM)
- Methodologies to Develop Radiation Testing Environments for Survivable Microelectronics
- Modeling-Enhanced Survivability Testing (MEST) Strategy for Microelectronics
- Methodologies to Develop Radiation Testing Environments for Survivable Microelectronics
Research funding history
123 SBIR/STTR records share this UEI (2005–2025). Reported award amounts total $66,765,345. Reported amounts are not federal obligations.
Phases: Phase I, Phase II, Phase II – Direct to Phase II
Agencies: Department of Defense, National Aeronautics and Space Administration, Department of Energy, Department of Health and Human Services, National Science Foundation, Department of Homeland Security