Development of GaN Substrates for High Power and M

Kyma Technologies proposes to document and model commonly observed GaN defect structures in device performance simulations to determine the acceptable level of defects to yield a Schottky diode appropriate for typical 600 V market specifications. Bulk GaN substrates have the potential to enable unprecedented GaN Schottky diode performance – better than Si and SiC devices – yet the bulk GaN materials must first be better understood and improved. By understanding which defects must be reduced or eliminated, we can understand the primary element in the critical path towards cost-effective high-yield high-performance Schottky diode device manufacturing. To such an end, Kyma has assembled a world class team of device and materials experts. In Phase I, a significant modeling effort will take place to determine the most important defects to reduce, mitigate or eliminate totally. Phase II will include a major device effort with the ultimate goal of producing device yields over a 2” diameter round wafer of greater than 50%.