Integrated CMOS Nuclear Event Detector Using on-Chip, Programmable Photocurrent Monitoring Circuitry

Reliable MicroSystems (Rel-Micro) will develop the techniques and circuitry needed to deploy a fully-integrated complementary metal oxide semiconductor (CMOS) Nuclear Event Detector (NED).  The NED will be developed using technology-agnostic application-specific integrated circuit (ASIC) design principles, but will target a DMEA-certified pure-play foundry process for pathfinder demonstration. The integrated NED design will include on-chip photocurrent detection, event discrimination using asymmetric differential-mode analog/mixed-signal techniques, local digital control allowing a tunable set point for the radiation trigger, and flexible integration within the circumvention and recovery (C&R) structure of a deployed system. The fully-realized prototype NED will support redundant design and RHBD circuit techniques on a single ASIC for radiation resiliency, potential on-chip intimate integration with C&R circuitry, portability across technology foundries, and flexible acquisition as a stand-alone component or library element within a technology offering available to the defense industrial base.