Integrated Complementary Metal Oxide Semiconductor Nuclear Event Detector for System on a Chip Applications

Reliable MicroSystems, LLC (Rel-Micro) proposes to implement and fabricate a fully-integrated CMOS Nuclear Event Detector (NED) using the techniques and circuitry developed under the Phase I and Phase 1 Option SBIR activities. The NED will leverage the Rel-Micro developed technology-agnostic application-specific integrated circuit (ASIC) design principles, but will be prototyped in a DMEA-certified foundry process. Rel-Micro will also demonstrate the portability of the NED design techniques through the implementation of the design to target another DMEA-certified Trusted Foundry process, which will be under the option phase activity.