Hotspot - Thermal Method for Verification of Semiconductor Authenticity

Complex defense systems require trusted and assured microelectronics to mitigate the threat of counterfeiting, reused components, and maliciously modified designs which are destined for high-reliability applications within Air Force systems.  By using specially designed algorithms against a known-good exemplar, Hotspot thermal imaging verifies the expected behavior of chips under test to show that they conform to expected performance established using the exemplar.  This technology is applicable to both newly developed systems and to sustainment of legacy systems which are suffering from Diminishing Manufacturing Sources and Material Shortages (DMSMS).  This mature technology developed by UC-Riverside has been under development for more than four years and is primed for commercialization.